Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement
| dc.contributor.author | Mondal, Kartick | |
| dc.date.accessioned | 2015-09-22T06:55:35Z | |
| dc.date.accessioned | 2023-10-19T10:35:35Z | |
| dc.date.available | 2015-09-22T06:55:35Z | |
| dc.date.available | 2023-10-19T10:35:35Z | |
| dc.date.issued | 2014 | |
| dc.description | Supervisor: Dipankar Bandyopadhyay | en_US |
| dc.description.abstract | Abstract not available | en_US |
| dc.identifier.other | ROLL NO. 09610703 | |
| dc.identifier.uri | https://gyan.iitg.ac.in/handle/123456789/474 | |
| dc.language.iso | en | en_US |
| dc.relation.ispartofseries | TH-1250; | |
| dc.subject | CHEMICAL ENGINEERING | en_US |
| dc.title | Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement | en_US |
| dc.type | Thesis | en_US |