Statistics for Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement
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Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement | 2 |
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January 2024 | 0 |
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TH-1250_09610703.pdf | 3 |