Statistics for Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement

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Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement 2

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TH-1250_09610703.pdf 7