Statistics for Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement
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Self-organized Interfacial Instabilities of Thin Films: Influence of Charge Leakage, Dielectric Anisotropy, and Confinement | 4 |
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October 2024 | 0 |
November 2024 | 0 |
December 2024 | 0 |
January 2025 | 0 |
February 2025 | 0 |
March 2025 | 0 |
April 2025 | 2 |
File Visits
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TH-1250_09610703.pdf | 12 |